Marvin Test Solutions GX5291 3U PXI High-Speed Dynamic Digital I/O Card

The GX5291 from Marvin Test Solutions is a 3U PXI dynamic digital I/O card that allows for a high-performance solution to be utilized for versatile digital testing applications. Equipped with 32 TTL or LVDS input or output channels, this I/O card features dynamic direction control on a per-channel basis. It features a 128 MB vector memory capacity to support deep-pattern testing and provides test rates up to 100 MHz for accurate and reliable signal processing over extended digital levels.

The GX5291 provides I/O voltage that is selectable between 1.5V, 1.8V, 2.5V, and 3.3V to respectively support standard logic families of TTL, LVTTL, CMOS, and LVCMOS. Output logic levels can be precisely adjusted from 1.4V to 3.6V via a programmable voltage source. Input thresholds are also adjustable to meet 1.5V to 3.3V ranges with 5V compatibility. Employing a windowing technique, the GX5291 minimizes PCI memory space requirements to 16 MB per board, conserving system resources. Continuous data transfer is also supported in direct mode, further expanding the capabilities of the system.

The vector memory configuration of the GX5291 allows the user to change channel widths and depths to suit specific needs of testing. Memory configurations range from 1 to 32 channels. An integrated PLL manages programmable clock frequencies and delays for exact timing control. The card provides internal TTL/LVTTL output clocks and strobes, and external clock input options are also supported, making it versatile for a wide variety of testing timing situations.

The GX5291 is also furnished with DIOEasy software, providing an intuitive interface with graphical vector development tools, waveform display, and a virtual instrument panel for real-time control. An included software suite allows use of 32-bit DLL driver libraries and provides programming language support for C/C++, Visual Basic, and LabVIEW to allow broader compatibility with a wide variety of automation and testing configurations.

For applications requiring the highest digital I/O performance, the GX5291 is ideal for ATE, semiconductor testing, display and printer testing, ASICs evaluation, and high-speed bi-directional bus testing. Robust features combined with flexible configuration make the GX5291 a reliable, high-speed digital I/O instrument for critical test and measurement applications.