Modular Systems > Marvin Test Solutions > GX7990 Series


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GX5293, 16 Input/Output Channels, Dynamic Digital I/O PXI Card
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Marvin Test Solutions GX5293 Dynamic Digital I/O PXI Card
The Marvin Test Solutions GX5293 is a high-performance, 3U PXI digital I/O card tailored for use in automated test environments that require high precision and flexibility of the digital interface. Equipped with 16 dynamically configured input/output channels, the GX5293 features per-pin control and allows popular signal standards such as LVTTL, CMOS, LVCMOS, or differential-LVDS, LVDM, and M-LVDS. This range of supported protocols makes the GX5293 well-suited for adapting to different test requirements across platforms, making the utility in complex testing setups much easier.
With a test rate of up to 200 MHz and 128 MB of onboard vector memory, the GX5293 handles high-speed data processing called for by sophisticated applications. The programmable voltage levels of the GX5293 and select input thresholds permit the output logic levels to be set between 1.4 V and 3.6 V, the input threshold can be configured at 1.5 V, 1.8 V, 2.5 V, or 3.3 V. This allows the design support for a variety of logic families using the GX5293. The board uses an onboard PLL to generate precise clock and strobe signals at frequencies up to 200 MHz for excellent timing accuracy.
The GX5293 can operate as a master card in a system in its own right or operate in synchronism with additional GX5293 or similar slave boards, significantly extending its channel count for more challenging test requirements. Internal and external timing control is supported by this card design, enabling the GX5293 to conduct high-speed data transfers and inputs from external strobes with ease, making it ideal for applications requiring valid and accurate data integrity across multiple channels.
Delivered with the DIOEasy software package, the GX5293 also includes vector editing, a virtual instrument panel, and driver libraries compatible with ATEasy, LabVIEW and Microsoft Visual Studio environments. These tools simplify setup, programming, and operation, allowing the GX5293 to be easily integrated into test systems. The PXI Card is ideal for use in ATE, semiconductor testing, and bi-directional bus emulation.
Model Name | GX5293 |
---|---|
Part Type | High-Speed Dynamic Digital I/O PXI Card |
Channels | 16 input/output channels with per-pin control (dynamically configurable) |
Maximum Test Rate | Up to 200 MHz |
Vector Memory Depth | 128 MB total |
Supported Logic Standards | LVTTL, CMOS, LVCMOS (1.5 V, 1.8 V, 2.5 V, 3.3 V), LVDS, LVDM, M-LVDS |
Programmable Output Voltage | 1.4 V to 3.6 V |
Input Thresholds | 1.5 V, 1.8 V, 2.5 V, 3.3 V |
Internal Clock Frequency | 5 Hz to 200 MHz, PLL configurable |
Software Compatibility | DIOEasy suite (supports LabVIEW, ATEasy, C/C++) |
Why Buy From Apex Waves:
"Hand carrying parts to fedex directly to make sure I get them overnight. Great service"
"They were very helpful to get me the test equipment that I need."
GX5293
Modular Systems > Marvin Test Solutions > GX7990 Series
GX5293, 16 Input/Output Channels, Dynamic Digital I/O PXI Card
1-800-915-6216
- Description
- Technical Specifications
Marvin Test Solutions GX5293 Dynamic Digital I/O PXI Card
The Marvin Test Solutions GX5293 is a high-performance, 3U PXI digital I/O card tailored for use in automated test environments that require high precision and flexibility of the digital interface. Equipped with 16 dynamically configured input/output channels, the GX5293 features per-pin control and allows popular signal standards such as LVTTL, CMOS, LVCMOS, or differential-LVDS, LVDM, and M-LVDS. This range of supported protocols makes the GX5293 well-suited for adapting to different test requirements across platforms, making the utility in complex testing setups much easier.
With a test rate of up to 200 MHz and 128 MB of onboard vector memory, the GX5293 handles high-speed data processing called for by sophisticated applications. The programmable voltage levels of the GX5293 and select input thresholds permit the output logic levels to be set between 1.4 V and 3.6 V, the input threshold can be configured at 1.5 V, 1.8 V, 2.5 V, or 3.3 V. This allows the design support for a variety of logic families using the GX5293. The board uses an onboard PLL to generate precise clock and strobe signals at frequencies up to 200 MHz for excellent timing accuracy.
The GX5293 can operate as a master card in a system in its own right or operate in synchronism with additional GX5293 or similar slave boards, significantly extending its channel count for more challenging test requirements. Internal and external timing control is supported by this card design, enabling the GX5293 to conduct high-speed data transfers and inputs from external strobes with ease, making it ideal for applications requiring valid and accurate data integrity across multiple channels.
Delivered with the DIOEasy software package, the GX5293 also includes vector editing, a virtual instrument panel, and driver libraries compatible with ATEasy, LabVIEW and Microsoft Visual Studio environments. These tools simplify setup, programming, and operation, allowing the GX5293 to be easily integrated into test systems. The PXI Card is ideal for use in ATE, semiconductor testing, and bi-directional bus emulation.
Model Name | GX5293 |
---|---|
Part Type | High-Speed Dynamic Digital I/O PXI Card |
Channels | 16 input/output channels with per-pin control (dynamically configurable) |
Maximum Test Rate | Up to 200 MHz |
Vector Memory Depth | 128 MB total |
Supported Logic Standards | LVTTL, CMOS, LVCMOS (1.5 V, 1.8 V, 2.5 V, 3.3 V), LVDS, LVDM, M-LVDS |
Programmable Output Voltage | 1.4 V to 3.6 V |
Input Thresholds | 1.5 V, 1.8 V, 2.5 V, 3.3 V |
Internal Clock Frequency | 5 Hz to 200 MHz, PLL configurable |
Software Compatibility | DIOEasy suite (supports LabVIEW, ATEasy, C/C++) |
Why Buy From Apex Waves
"The business transaction was super easy and friendly."
"Hand carrying parts to fedex directly to make sure I get them overnight. Great service"
"They were very helpful to get me the test equipment that I need."