National Instruments GP36-DB25-2-HD Spring Pin Cable

The National Instruments GP36-DB25-2-HD is a high-quality spring pin cable for semiconductor test systems and other applications that require reliable, repeatable electrical connections. This accessory has been designed according to the RoHS standard and thus assures ecologically harmless and hazard-free operation. Integrating 36-position pogo pin blocks with shielded cabling and a DB25 connector allows the performance of precise and effective testing in an industrial and laboratory environment.

It comes with a highly durable 36-position pogo pin block, featuring arrays of spring-loaded pins for robust and consistent connectivity. The engineering of the pins ensures temporary yet reliable electrical contact, very important in applications needing repeated connections and disconnections. These are designed to limit signal degradation and assure optimal performance in testing procedures.

The DB25 connector in the GP36-DB25-2-HD is a D-subminiature connector with two rows of 25 pins each. Further, the D-shaped shell improves secure connection and good alignment of devices, thereby reducing the possibility of misconnection. Each of the 25 pins on the DB25 connector has some assigned function, such as data transmission, control signaling, and power delivery, making it versatile for various testing arrangements. Such a kind of connector is highly popular for serial and parallel printer interfaces, such as RS-232/EIA-232, and sometimes for SCSI applications.

The shielded construction of the cable prevents electromagnetic interference, maintaining signal integrity even in electrically noisy environments. This shielding is very important in semiconductor testing, where accuracy and precision of data are highly required. Engineered to National Instruments semiconductor test standards, the GP36-DB25-2-HD ensures consistent, high performance, and high-frequency and extreme conditions operations. Multipoint simultaneous connections through 36-position pogo pin blocks with DB25 connectors greatly minimize testing inefficiency due to the connectivity that complex processes involve.