Modular Systems > National Instruments > SLSC Series




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SET-3000, High-Density, Modular Architecture, Semiconductor Test System
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National Instruments SET-3000 Semiconductor Test System
The National Instruments SET-3000 is an advanced hardware platform tailored for semiconductor testing applications, specifically designed to perform fault insertion and signal simulation with high precision. The SET-3000 integrates into HiL test environments and allows fault conditions like open-circuit and short-circuit situations. This makes the SET-3000 an essential component within such areas as automotive and aerospace industries, which demand a very high level of testing procedures where faultless safety and dependability for the electronic component must be ensured.
The SET-3000 is based on a modular PXI platform developed by National Instruments and hence offers scalability and flexibility in semiconductor test systems. Equipped with high-density fault insertion modules, the SET-3000 allows the engineer to simulate complex fault scenarios with the retention of precise signal integrity. Most importantly, the SET-3000 addresses production test applications where speed and repeatability are of paramount importance, enabling the manufacturer to quickly find and eliminate prospective device failures throughout the production cycle.
The SET-3000 grants ease of integration with industry-standard software like LabVIEW and TestStand, adding flexibility in automated test systems. Equipped with programmable fault conditions, the SET-3000 ensures that digital and analog signals are thoroughly tested for performance under a variety of fault conditions, hence becoming an essential tool in device performance analysis. Modularity within the SET-3000 allows easy upgrades to address changing test requirements and enables long-term usability in multiple applications.
Besides its fault stimulation capabilities, the SET-3000 demonstrates extraordinary performance in real-time data acquisition and high-speed signal processing. Such features make the SET-3000 a reliable solution for a semiconductor production line where the least amount of downtime and consistency maintenance is of prime importance. The compact design and energy efficiency of the SET-3000 further enhance its suitability for application in laboratories and manufacturing processes where there are often highly imposing constraints on space and power.
Model Name | SET-3000 |
---|---|
Part Type | Semiconductor Test System |
Operating Humidity | 10%-90% Relative, Non-Condensing |
Storage Humidity | 5%-95% Relative, Non-Condensing |
Operating Temperature | 0°C to 40°C (Forced-Air Cooling) |
Storage Temperature | -40°C to 85°C |
Maximum Altitude | 2000 meters above sea level |
Fault Simulation | Open/Short Circuits, Pin-to-Pin Shorts |
Software Integration | Compatible with LabVIEW and TestStand |
Channel Density | High-density modular PXI architecture |
Why Buy From Apex Waves:
"Hand carrying parts to fedex directly to make sure I get them overnight. Great service"
"They were very helpful to get me the test equipment that I need."
SET-3000
Modular Systems > National Instruments > SLSC Series
SET-3000, High-Density, Modular Architecture, Semiconductor Test System
1-800-915-6216
- Description
- Technical Specifications
National Instruments SET-3000 Semiconductor Test System
The National Instruments SET-3000 is an advanced hardware platform tailored for semiconductor testing applications, specifically designed to perform fault insertion and signal simulation with high precision. The SET-3000 integrates into HiL test environments and allows fault conditions like open-circuit and short-circuit situations. This makes the SET-3000 an essential component within such areas as automotive and aerospace industries, which demand a very high level of testing procedures where faultless safety and dependability for the electronic component must be ensured.
The SET-3000 is based on a modular PXI platform developed by National Instruments and hence offers scalability and flexibility in semiconductor test systems. Equipped with high-density fault insertion modules, the SET-3000 allows the engineer to simulate complex fault scenarios with the retention of precise signal integrity. Most importantly, the SET-3000 addresses production test applications where speed and repeatability are of paramount importance, enabling the manufacturer to quickly find and eliminate prospective device failures throughout the production cycle.
The SET-3000 grants ease of integration with industry-standard software like LabVIEW and TestStand, adding flexibility in automated test systems. Equipped with programmable fault conditions, the SET-3000 ensures that digital and analog signals are thoroughly tested for performance under a variety of fault conditions, hence becoming an essential tool in device performance analysis. Modularity within the SET-3000 allows easy upgrades to address changing test requirements and enables long-term usability in multiple applications.
Besides its fault stimulation capabilities, the SET-3000 demonstrates extraordinary performance in real-time data acquisition and high-speed signal processing. Such features make the SET-3000 a reliable solution for a semiconductor production line where the least amount of downtime and consistency maintenance is of prime importance. The compact design and energy efficiency of the SET-3000 further enhance its suitability for application in laboratories and manufacturing processes where there are often highly imposing constraints on space and power.
Model Name | SET-3000 |
---|---|
Part Type | Semiconductor Test System |
Operating Humidity | 10%-90% Relative, Non-Condensing |
Storage Humidity | 5%-95% Relative, Non-Condensing |
Operating Temperature | 0°C to 40°C (Forced-Air Cooling) |
Storage Temperature | -40°C to 85°C |
Maximum Altitude | 2000 meters above sea level |
Fault Simulation | Open/Short Circuits, Pin-to-Pin Shorts |
Software Integration | Compatible with LabVIEW and TestStand |
Channel Density | High-density modular PXI architecture |
Why Buy From Apex Waves
"The business transaction was super easy and friendly."
"Hand carrying parts to fedex directly to make sure I get them overnight. Great service"
"They were very helpful to get me the test equipment that I need."